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TCTS Lab Staff
 
 



Devrim UNAY

[Groups] [Publications]

Senior researcher, PhD  

University of Mons (UMONS) 
Engineering Faculty of Mons (FPMs) 

Numediart Research Institute  
Infortech Research Institute  
TCTS Lab  
31, Boulevard Dolez  
B-7000 Mons (Belgium)  

phone: +32 65 374745  
fax: +32 65 374729  
devrim.unay


Devrim Unay holds an electrical and electronics engineering degree (1999) and a master of science degree in biomedical engineering (2001) both from Bogazici University, Turkey. He obtained his PhD degree from FPMs in June 2006 by the work "Multispectral Image Processing and Pattern Recognition Techniques for Quality Grading of Apple Fruits" performed under the supervision of B. Gosselin.
His research interests are image processing, pattern recognition and classification. He worked in the MAIS project, while he was engaged to the CAPA project previously.
Groups :

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Publications :

PhD Dissertation

2006
D. UNAY, 2006, "Multispectral Image Processing and Pattern Recognition Techniques for Quality Inspection of Apple Fruits", PhD thesis supervised by Prof. B. Gosselin.

Regular Papers in Journals

2011
D. UNAY, B. GOSSELIN, O. KLEYNEN, V. LEEMANS, M.-F. DESTAIN , O. DEBEIR, 2011, "Automatic grading of Bi-colored apples by multispectral machine vision", Computers and Electronics in Agriculture, Volume 75, Issue 1, January 2011, Pages 204-212.
2007
D. UNAY, B. GOSSELIN, 2007, "Stem and Calyx Recognition on 'Jonagold' Apples by Pattern Recognition", Journal of Food Engineering, Volume 78, Issue 2 (2007), 597-605.
2006
D. UNAY, B. GOSSELIN, 2006, "Automatic Defect Segmentation of 'Jonagold' Apples on Multi-Spectral Images: A Comparative Study", Journal of Postharvest Biology and Technology, Volume 42, Issue 3, (2006), 271-279.

Papers in Conference Proceedings

2007
M. MANCAS, B. GOSSELIN, B. MACQ, D. UNAY, 2007, "Computational Attention for Defect Localisation", Proceedings of ICVS Workshop on Computational Attention & Applications (WCAA-2007), Bielefeld, Germany, Mar 2007.
2006
D. UNAY, B. GOSSELIN, 2006, "Apple Defect Segmentation by Artificial Neural Networks", in Proceedings of BeNeLux Conference on Artificial Intelligence (BNAIC 2006), Namur, Belgium.
D. UNAY, O. DEBEIR, B. GOSSELIN, 2006, "Apple Stem and Calyx Recognition by Decision Trees", in Proceesings of the IASTED Visualization, Imaging and Image Processing Conference (VIIP 2006), Palma de Mallorca, Spain.
2005
D. UNAY, B. GOSSELIN, 2005, "Artificial Neural Network-based Segmentation and Apple Grading by Machine Vision", Proc. of IEEE ICIP 2005, Genova, Italy.
Z. HAMMAL, B. BOZKURT, L. COUVREUR, D. UNAY, A. CAPLIER, T. DUTOIT, 2005, "Classification d'Expressions Vocales Passives Versus Actives", Proc. of the GRETSI Conference, Louvain la Neuve, Belgium.
Z. HAMMAL, B. BOZKURT, A. CAPLIER, L. COUVREUR, T. DUTOIT, D. UNAY, 2005, "Passive versus active: vocal classification system", Proc. of EUSIPCO' 05, Turkey.
D. UNAY, B. GOSSELIN, 2005, "Thresholding-based Segmentation and Apple Grading by Machine Vision", Proc. of EUSIPCO 2005, Antalya, Turkey.
2004
D. UNAY, B. GOSSELIN, 2004, "A Quality Grading Approach for 'Jonagold' Apples", Proc. of Fourth IEEE Benelux Signal Processing Symposium (IEEE SPS 2004), April 15-16, 2004, Hilvarenbeek (the Netherlands).
D. UNAY, B. GOSSELIN, 2004, "A Quality Sorting Method For `Jonagold` Apples", Proceedings of AgEng Leuven 2004 - Engineering the Future (International Conference of Agricultural Engineering), Leuven, Belgium.
D. UNAY, B. GOSSELIN, 2004, "An Approach for Recognizing Stem-end/Calyx regions in Apple Quality Sorting", Proceedings of ACIVS 2004 Conference (Advanced Concepts for Intelligent Vision Systems), Brussels, Belgium.
D. UNAY, B. GOSSELIN, 2004, "Stem-end/Calyx Detection in Apple Fruits: Comparison of Feature Selection Methods and Classifiers", Proceedings of ICCVG 2004 Conference (International Conference on Computer Vision and Graphics 2004), Warsaw, Poland.
2003
D. UNAY, B. GOSSELIN, 2003, "A Study on Quality Grading of 'Jonagold' Apples", Proc. of the 3rd IEEE International Symposium on Signal Processing and Information Technology (IEEE ISSPIT 2003), Darmstadt (Germany).
2002
D. UNAY, B. GOSSELIN, 2002, "Apple Defect Detection and Quality Classification with MLP-Neural Networks", Proc. of PRORISC 2002, Eindhoven, the Netherlands.

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